Imagine measuring multiple material properties of your choice in real-time,
non-destructively,
with a single instrument
A paradigm shift in manufacturing intelligence using cold atmospheric plasma and physics-informed machine learning to create multifaceted material fingerprints instantly
Wafer to Wafer
Optimizing advanced material characterization and process control for wafer to wafer manufacturing.
Piece to Piece
Delivering precise, real-time insights for individual components, enabling smarter decision-making and improved quality control.
Sheet to Sheet
Enhancing material analysis for sheet to sheet manufacturing, driving uniformity, performance, and defect reduction.
Roll to Roll
Empowering continuous manufacturing with real-time characterization, optimizing quality and efficiency in roll-to-roll processes.
