Imagine measuring multiple material properties of your choice in real-time, non-destructively, with a single instrument
SirenOpt is initiating a paradigm shift in manufacturing intelligence by using cold atmospheric plasma and physics-informed machine learning to create multifaceted material fingerprints instantly.
Wafer to Wafer
Optimizing advanced material characterization and process control for wafer to wafer manufacturing.
Piece to Piece
Delivering precise, real-time insights for individual components, enabling smarter decision-making and improved quality control.
Sheet to Sheet
Enhancing material analysis for sheet to sheet manufacturing, driving uniformity, performance, and defect reduction.
Roll to Roll
Empowering continuous manufacturing with real-time characterization, optimizing quality and efficiency in roll-to-roll processes.
We transform measurement blind spots into rich multi-layered material insights, which enable intelligent performance-centric decision-making. SirenOpt thus accelerates R&D and process optimization, enhances product performance, and delivers higher production quality to maximize value in both in-line and off-line applications.
We transform measurement blind spots into rich multi-layered material insights, which enable intelligent performance-centric decision-making. SirenOpt thus accelerates R&D and process optimization, enhances product performance, and delivers higher production quality to maximize value in both in-line and off-line applications.
*The data presented is for illustrative purposes only.
Adding Measurement Variety to Better Track a Material's Functional Properties on the Production Line
Compare SirenOpt with the Legacy Solutions
